Optimize the top margin of raw password
This commit is contained in:
parent
5c7ccc5b37
commit
3f3360259a
1 changed files with 3 additions and 3 deletions
|
|
@ -838,7 +838,7 @@
|
|||
<autoresizingMask key="autoresizingMask" widthSizable="YES" heightSizable="YES"/>
|
||||
<subviews>
|
||||
<textView clipsSubviews="YES" multipleTouchEnabled="YES" contentMode="scaleToFill" preservesSuperviewLayoutMargins="YES" editable="NO" translatesAutoresizingMaskIntoConstraints="NO" id="3dt-Ph-4As">
|
||||
<rect key="frame" x="20" y="10" width="374" height="726"/>
|
||||
<rect key="frame" x="20" y="72" width="374" height="664"/>
|
||||
<color key="backgroundColor" white="1" alpha="1" colorSpace="calibratedWhite"/>
|
||||
<string key="text">K7PBbkoaJf6mLyVX3EBU
|
||||
username: passforios-demo@email.com
|
||||
|
|
@ -853,8 +853,8 @@ Phone Support PIN #: 84719</string>
|
|||
<constraints>
|
||||
<constraint firstAttribute="trailingMargin" secondItem="3dt-Ph-4As" secondAttribute="trailing" id="2IV-7r-9eG"/>
|
||||
<constraint firstItem="7JD-uM-IyS" firstAttribute="top" secondItem="3dt-Ph-4As" secondAttribute="bottom" id="3yp-aL-exH"/>
|
||||
<constraint firstItem="3dt-Ph-4As" firstAttribute="top" secondItem="XeK-cv-AXf" secondAttribute="bottom" constant="-54" id="5y9-J3-Luj"/>
|
||||
<constraint firstAttribute="leadingMargin" secondItem="3dt-Ph-4As" secondAttribute="leading" id="jgf-j1-lNa"/>
|
||||
<constraint firstItem="3dt-Ph-4As" firstAttribute="top" secondItem="XeK-cv-AXf" secondAttribute="bottom" constant="8" symbolic="YES" id="yN7-0c-t4Y"/>
|
||||
</constraints>
|
||||
</view>
|
||||
<navigationItem key="navigationItem" title="Raw Password" id="c13-zM-tLf">
|
||||
|
|
@ -1805,7 +1805,7 @@ Cgo
|
|||
<image name="Settings" width="25" height="25"/>
|
||||
</resources>
|
||||
<inferredMetricsTieBreakers>
|
||||
<segue reference="iCM-Fy-hkk"/>
|
||||
<segue reference="WfV-6d-ZUj"/>
|
||||
<segue reference="yyD-4H-pLE"/>
|
||||
</inferredMetricsTieBreakers>
|
||||
</document>
|
||||
|
|
|
|||
Loading…
Add table
Add a link
Reference in a new issue